Earthing grid
Assess grid resistance, touch and step voltages with the IEEE Std 80-2013 closed-form screen.
1 · Soil and surface
Soil model
Ω·m
Ω·m
Ω·m
m
2 · Grid geometry
m
m
m
m
cond.
cond.
Equal-mesh model: D = Lx/(Nx − 1) = Ly/(Ny − 1).
3 · Conductor
mm
4 · Fault
5 · Ground rods
rods
m
Rod diameter 16 mm unless a saved record declares another value.
6 · Advanced inputs
s
ratio
Results
Analytic screen against the tolerable touch and step voltages.
Plan view and section
Plan view: Lx × Ly grid mesh and ground rods (positions illustrative); Em worst-case corner mesh (symmetric); Es and GPR hotspots.
Vertical section: crushed rock ρs / hs, native soil ρ (or two-layer ρ₁ / ρ₂ with reflection K), burial depth h and rod Lr. Schematic, not to scale.
Detailed analysis Steps, geometry, compliance and audit
IEEE Std 80-2013 §11–§16
Document
Record details, engineering notes and references for the printed calculation.
Engineering notes
- Screening-level calculation per IEEE 80 closed-form equations. Field-critical designs verified with FEM (CDEGS / ETAP GroundMat / WinIGS).
- Soil resistivity assumed measured; Wenner four-pin survey per IEEE 80 §13.3 out of scope.
- Split factor Sf from system data; default 1.0 produces a conservative over-design (§15.9 Annex C).
- Transferred potentials (§17), fence grounding (§19), lightning / transients (AS/NZS 1768, IEC 62305) not modelled.
References
- Awaiting inputs.